Barha CK, Falck RS, Best JR, Nagamatsu LS, Hsiung GR, Sheel AW, Hsu CL, Kramer AF, Voss MW, Erickson KI, Davis JC, Shoemaker JK, Boyd L, Crockett RA, Ten Brinke L, Bherer L, Singer J, Galea LAM, Jacova C, Bullock A, Grant S, Liu-Ambrose T
2022. IEEE International Conference on Electro Information Technology (eIT), Mankato, MN, USA. 1-4
Sladky V, Nejedly P, Mivalt F, Brinkmann B, Kim I, St Louis EK, Gregg NM, Lundstrom BN, Crowe CM, Attia TP, Crepeau D, Balzekas I, Marks VS, Wheeler LP, Cimbalnik J, Cook M, Janca R, Sturges BK, Leyde K, Miller KJ, Van Gompel J, Denison T, Worrell G, Kremen V